IEC 61726:2022描述了通过混响室测量方法（也称为模式搅拌室方法）测量屏蔽衰减。 本文件适用于电缆组件、电缆、连接器和无源微波组件的屏蔽衰减测量，如波导、移相器、双工器/多工器、功率分配器/组合器等。 这第四版取消并取代了2015年出版的第三版。与上一版相比，此版本包括以下重大技术变更: a.重新措辞的第1条"范围"； b.将第2条中的IEC 62153（所有部分）替换为IEC TS 62153-4-1； c.增加了3.1中筛选衰减的定义； d.增加第4条“筛选衰减测量原理”； e.添加了一些测试集的描述-ups，如第5条中的频率合成器、频谱分析仪、步进电机、链接装置和采样系统等； f.增加条款6“DUT”； g.重新措辞的第7条“测量程序”； h.增加第8条“注意事项”； i.增加第9条“验收标准”； j.增加第10条“相关规范中应提供的信息”。

IEC 61726:2022 describes the measurement of screening attenuation by the reverberation chamber measurement method, also called mode stirred chamber method.
This document is applicable to screening attenuation measurements of cable assemblies, cables, connectors, and passive microwave components, such as waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners, etc.
This fourth edition cancels and replaces the third edition published in 2015. This edition includes the following significant technical changes with respect to the previous edition:
a. reworded Clause 1 "Scope";
b. replaced IEC TS 62153-4-1 by IEC 62153 (all parts) in Clause 2;
c. added the definition of screening attenuation in 3.1;
d. added Clause 4 "Principle of screening attenuation measurement";
e. added the descriptions of some test set-ups, such as frequency synthesizer, spectrum analyser, stepper motor, linking devices and the sampling system, etc. in Clause 5;
f. added Clause 6 "DUT";
g. reworded Clause 7 "Measurement procedure";
h. added Clause 8 "Caution notes";
i. added Clause 9 "Acceptance criterion";
j. added Clause 10 "Information to be given in the relevant specification".