本文件描述了使用原子力显微镜（AFM）测定柔顺材料弹性模量的程序。测量了柔顺材料表面上的力-距离曲线，并使用基于Johnson-Kendall-Roberts（JKR）理论的两点法进行分析。本文件适用于弹性模量在100 kPa至1 GPa之间的兼容材料。空间分辨率取决于AFM探针和表面之间的接触半径，通常约为10-20 nm。交叉引用:ISO 11775ISO 18115-2ISO 19606购买本文件时可获得的所有现行修订均包含在购买本文件中。

This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.Cross References:ISO 11775ISO 18115-2ISO 19606All current amendments available at time of purchase are included with the purchase of this document.