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现行 IEC 60068-2-82:2019
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Environmental testing - Part 2-82: Tests - Test Xw1: Whisker test methods for components and parts used in electronic assemblies 环境试验.第2-82部分:试验.试验XW1:电子组件用元器件的晶须试验方法
发布日期: 2019-05-14
IEC 60068-2-82:2019规定了电气或电子元件和机械零件(如冲压/冲压零件)表面光洁度的晶须倾向测试(例如,跳线、静电放电保护罩、机械固定件、压配合销和电子组件中使用的其他机械零件)代表成品阶段,具有锡或锡合金光洁度。不考虑或评估在所需测试流程期间模制化合物、塑料等的物理尺寸的变化。测试方法是通过使用基于知识的方法开发的。 与上一版相比,此版本包括以下重大技术变更: -将测试标准的范围从电子扩展到机电元件和压力机-配合引脚,用于组装和互连技术; -通过基于知识的测试条件选择显著减少测试工作量,即可以省略与给定材料系统无关的测试(见附录D); -通过省略温度循环试验的严重性M、N,与JESD 201A保持一致; -通过引入85%相对湿度的升高湿度下的测试条件,湿热测试的测试持续时间(1 000小时而不是4 000小时)。和85℃的温度提供增加的严重性。
IEC 60068-2-82:2019 specifies tests for the whiskering propensity of surface finishes of electric or electronic components and mechanical parts such as punched/stamped parts (for example, jumpers, electrostatic discharge protection shields, mechanical fixations, press?fit pins and other mechanical parts used in electronic assemblies) representing the finished stage, with tin or tin-alloy finish. Changes of the physical dimensions of mould compounds, plastics and the like during the required test flow are not considered or assessed. The test methods have been developed by using a knowledge-based approach.
This edition includes the following significant technical changes with respect to the previous edition:
– extension of the scope of the test standard from electronic to electromechanic components and press-fit pins, which are used for assembly and interconnect technology;
– significant reduction of the testing effort by a knowledge-based selection of test conditions i.e. tests not relevant for a given materials system can be omitted (see Annex D);
– harmonization with JESD 201A by omission of severities M, N for temperature cycling tests;
– highly reduced test duration (1 000 h instead of 4 000 h) for damp-heat test by introducing test condition at elevated humidity of 85 % R.H. and a temperature of 85 °C providing increased severity.
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归口单位: TC 91
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