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Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation 陶瓷原材料和基础材料的试验.直流电弧激发OES法直接测定碳化硅粉末和颗粒中杂质的质量分数
发布日期: 2011-04-01
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发布单位或类别: 德国-德国标准化学会
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研制信息
相似标准/计划/法规
现行
BS EN ISO 14720-1-2013
Testing of ceramic raw and basic materials. Determination of sulfur in powders and granules of non-oxidic ceramic raw and basic materials-Infrared measurement methods
陶瓷原材料和基本材料的测试 非氧化陶瓷原材料和基础材料粉末和颗粒中硫的测定
2013-04-30
现行
ISO 14720-1-2013
Testing of ceramic raw and basic materials — Determination of sulfur in powders and granules of non-oxidic ceramic raw and basic materials — Part 1: Infrared measurement methods
陶瓷原材料和基础材料的测试——非氧化陶瓷原材料和基本材料粉末和颗粒中硫的测定第1部分:红外测量方法
2013-02-14
现行
DIN 51030
Testing of ceramic raw and basic materials - Determination of dry bending strength of unfired products
陶瓷原材料和基本材料的试验.未燃烧产品干弯曲强度的测定
2015-01-01
现行
DIN 51084
Testing of oxidic raw and basic materials for ceramic, glass and glazes - Determination of fluoride content
陶瓷、玻璃和釉料用氧化原材料和基础材料的试验.氟化物含量的测定
2008-11-01
现行
DIN EN ISO 14720-1
Testing of ceramic raw and basic materials - Determination of sulfur in powders and granules of non-oxidic ceramic raw and basic materials - Part 1: Infrared measurement methods (ISO 14720-1:2013)
陶瓷原材料和基础材料的试验.非氧化陶瓷原材料和基础材料粉末和颗粒中硫的测定.第1部分:红外测量方法(ISO 14720-1-2013);德文版EN ISO 14720-1:2013
2013-06-01
现行
DIN 51095-1
Testing of ceramic raw and basic materials - Determination of content of sulphur in powders and granules of non-oxidic ceramic raw and basic materials - Part 1: Infrared measurement after digestion in the induction furnace
陶瓷原材料和基本材料的试验.非氧化陶瓷原材料和基本材料粉末和颗粒中硫含量的测定.第1部分:感应炉消化后的红外测量
2007-12-01
现行
BS EN 15979-2011
Testing of ceramic raw and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation
陶瓷原材料和基本材料的测试 直流电弧激发OES法直接测定碳化硅粉末和颗粒中杂质的质量分数
2011-02-28
现行
BS 11/30227621 DC
BS EN ISO 14720-1. Testing of ceramic raw and basic materials. Determination of sulfur in powders and granules of non-oxidic ceramic raw and basic materials. Part 1. Infrared measurement methods
BS EN ISO 14720-1 陶瓷原材料和基本材料的测试 非氧化陶瓷原材料和基本材料粉末和颗粒中硫的测定 第一部分 红外测量方法
2011-05-04
现行
DIN 51068
Testing of ceramic raw and basic materials - Determination of resistance to thermal shock - Water quenching method for refractory bricks
陶瓷原材料和基础材料的试验.抗热震性的测定.耐火砖的水淬法
2008-11-01
现行
BS 09/30187538 DC
BS EN 15979. Testing of ceramic raw and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation
英国标准EN 15979 陶瓷原材料和基本材料的测试 直流电弧激发OES法直接测定碳化硅粉末和颗粒中杂质的质量分数
2009-08-05
现行
BS EN ISO 14720-2-2013
Testing of ceramic raw and basic materials. Determination of sulfur in powders and granules of non-oxidic ceramic raw and basic materials-Inductively coupled plasma optical emission spectrometry (ICP/OES) or ion chromatography after burning in an oxygen flow
陶瓷原材料和基本材料的测试 非氧化陶瓷原材料和基础材料粉末和颗粒中硫的测定
2013-04-30
现行
ISO 14720-2-2013
Testing of ceramic raw and basic materials — Determination of sulfur in powders and granules of non-oxidic ceramic raw and basic materials — Part 2: Inductively coupled plasma optical emission spectrometry (ICP/OES) or ion chromatography after burning in an oxygen flow
陶瓷原材料和基础材料的测试——非氧化陶瓷原材料和基本材料粉末和颗粒中硫的测定第2部分:在氧气流中燃烧后的电感耦合等离子体发射光谱法(ICP/OES)或离子色谱法
2013-02-14
现行
DIN 51095-2
Testing of ceramic raw and basic materials - Determination of content of sulphur in powders and granules of non-oxidic ceramic raw and basic materials - Part 2: Optical emission spectrometry by inductively coupled plasma (ICP OES) or ion chromatography (IC) after burning in an oxygen flow
陶瓷原材料和基本材料的试验.非氧化陶瓷原材料和基本材料粉末和颗粒中硫含量的测定.第2部分:在氧气流中燃烧后用电感耦合等离子体(ICP OES)或离子色谱法(IC)进行光发射光谱测定
2007-11-01
现行
DIN 51096
Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) and electrothermal vaporisation (ETV)
陶瓷原材料和基础材料的试验.用电感耦合等离子体发射光谱法(ICP OES)和电热蒸发法(ETV)直接测定碳化硅粉末和颗粒中杂质的质量分数
2008-07-01
现行
DIN EN ISO 14720-2
Testing of ceramic raw and basic materials - Determination of sulfur in powders and granules of non-oxidic ceramic raw and basic materials - Part 2: Inductively coupled plasma optical emission spectrometry (ICP/OES) or ion chromatography after burning in an oxygen flow (ISO 14720-2:2013)
陶瓷原材料和基本材料的试验.非氧化陶瓷原材料和基本材料粉末和颗粒中硫的测定.第2部分:在氧气流中燃烧后的电感耦合等离子体发射光谱法(ICP/OES)或离子色谱法(ISO 14720-2-2013);德国版
2013-06-01
现行
BS 11/30227624 DC
BS EN ISO 14720-2. Testing of ceramic raw and basic materials. Determination of sulfur in powders and granules of non-oxidic ceramic raw and basic materials. Part 2. Inductively coupled plasma atomic emission spectrometry (ICP/AES) or ion chromatography after burning in an oxygen flow
BS EN ISO 14720-2 陶瓷原材料和基本材料的测试 非氧化陶瓷原材料和基本材料粉末和颗粒中硫的测定 第二部分 在氧气流中燃烧后的电感耦合等离子体原子发射光谱法(ICP/AES)或离子色谱法
2011-05-04
现行
DIN 51086-3
Testing of oxidic raw and basic materials for ceramics, glass and glazes - Part 3: Spectrophotometric determination of chrome(VI) with diphenyl carbazide in the presence of chrome(III)
陶瓷、玻璃和釉料用氧化原材料和基础材料的试验第3部分:在铬(III)存在下用二苯基碳酰二肼分光光度法测定铬(VI)
2007-04-01
现行
DIN 51096-DRAFT
Draft Document - Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) and electrothermal vaporisation (ETV)
文件草案.陶瓷原材料和基础材料的试验.用电感耦合等离子体发射光谱法(ICP OES)和电热蒸发法(ETV)直接测定碳化硅粉末和颗粒中杂质的质量分数
2007-09-01
现行
DIN 51088
Testing of ceramic raw and basic materials - Determination of mass fractions of metallic trace impurities in silicon carbide powders and granular silicon carbides by optical emission spectrometry and excitation in the DC arc
陶瓷原材料和基础材料的试验.用光发射光谱法和直流电弧激发法测定碳化硅粉末和粒状碳化硅中金属微量杂质的质量分数
2007-12-01
现行
DIN 51457
Testing of ceramic raw and basic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP OES) and by electrothermal vaporization (ETV) under the action of a halogenated reaction gas (modifiers)
陶瓷原材料和基础材料的试验.在卤化反应的作用下 通过电感耦合等离子体(ICP OES)和电热蒸发(ETV)的光发射光谱法直接测定石墨粉末、颗粒和块状物中痕量杂质的质量分数
2017-05-01