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现行 MIL MIL-PRF-55342H Amendment 3(all prev amd incorp.)
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Resistor, Chip, Fixed, Film, Nonestablished Reliability, Established Reliability, Space Level, General Specification for 非确定可靠性、确定可靠性、空间级固定薄膜电阻器通用规范
发布日期: 2015-06-09
本规范涵盖了主要用于表面安装和混合电路应用的未建立可靠性(非ER)、已建立可靠性(ER)和空间级固定薄膜片式电阻器的一般要求。这些电阻器在正常条件下相对于时间具有高度稳定性。本规范涵盖的ER电阻器的寿命故障率(FR)范围为每1000小时1%至0.001%(见1.2.7)。这些FR是在寿命测试的基础上以60%的置信度建立的。表I提供了这些电阻器的性能特性摘要。设计师应注意在高功率脉冲应用中使用这些电阻器(见6.7)。
This specification covers the general requirements for nonestablished reliability (non-ER), established reliability (ER), and space level, fixed, film, chip resistors primarily intended for incorporation into surface mount and hybrid circuit applications. These resistors have a high degree of stability with respect to time under normal conditions. ER resistors covered by this specification have life failure rates (FR) ranging from 1 percent to 0.001 percent per 1,000 hours (see 1.2.7). These FRs are established at 60 percent confidence on the basis of life tests. Table I provides a summary of performance characteristics for these resistors. Designers are CAUTIONED on using these resistors in high power pulses applications (see 6.7).
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发布单位或类别: 美国-美国军事规范和标准
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