现行

BS ISO 20289-2018

Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
表面化学分析 水的全反射X射线荧光分析

2018-03-23

现行

ISO 20289-2018

Surface chemical analysis — Total reflection X-ray fluorescence analysis of water
表面化学分析 - 水的全反射X射线荧光分析

2018-03-15

现行

BS PD ISO/TS 18507-2015

Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
表面化学分析 全反射X射线荧光光谱法在生物和环境分析中的应用

2015-07-31

现行

ISO/TS 18507-2015

Surface chemical analysis — Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
表面化学分析 - 全反射X射线荧光光谱在生物和环境分析中的应用

2015-07-22

现行

BS ISO 14706-2014

Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
表面化学分析 全反射X射线荧光光谱法测定硅片表面元素污染

2014-07-31

现行

JIS K 0148-2005

Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
表面化学分析用全反射X射线荧光光谱法（TXRF）测定硅片表面元素污染

2005-01-01

现行

GB/T 40110-2021

表面化学分析 全反射X射线荧光光谱法（TXRF）测定硅片表面元素污染
Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

2021-05-21

现行

ISO 14706-2014

Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
表面化学分析 - 通过全反射X射线荧光（TXRF）光谱测定硅晶片上的表面元素污染

2014-07-25

现行

BS ISO 17331-2004+A1-2010

Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
表面化学分析 硅片工作标准物质表面元素收集的化学方法及其全反射X射线荧光光谱测定

2010-09-30

现行

GB/T 30701-2014

表面化学分析 硅片工作标准样品表面元素的化学收集方法和全反射X射线荧光光谱法（TXRF）测定
Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

2014-03-27

现行

ISO 17331-2004

Surface chemical analysis — Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
表面化学分析——硅片工作标准物质表面元素收集的化学方法及其全反射X射线荧光光谱测定

2004-05-18

现行

KS L 5222(2019 Confirm)

시멘트의 형광 X선 분석 방법
通过x射线荧光水泥的化学分析方法

2009-10-30

现行

ISO 17331-2004/Amd 1-2010

Surface chemical analysis — Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy — Amendment 1
表面化学分析.硅片工作标准物质表面元素收集及其全反射X射线荧光光谱测定的化学方法.修改件1

2010-07-05

现行

BS ISO 10810-2019

Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
表面化学分析 X射线光电子能谱 分析指南

2019-08-23

现行

GB/T 30704-2014

表面化学分析　X射线光电子能谱　分析指南
Surface chemical analysis—X-ray photoelectron spectroscopy—Guidelines for analysis

2014-06-09

现行

ISO 10810-2019

Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
表面化学分析 - X射线光电子能谱分析指南

2019-08-22

现行

BS ISO 29581-2-2010

Cement. Test methods-Chemical analysis by X-ray fluorescence
水泥测试方法

2010-05-31

现行

BS EN ISO 21587-2-2007

Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method)-Wet chemical analysis
铝硅酸盐耐火制品的化学分析（X射线荧光法的替代方法）

2007-10-31

现行

YS/T 869-2013

4A沸石化学成分分析方法　X射线荧光法
Chemical analysis of 4A-Zeolite— X-ray fluorescence spectrometric method

2013-04-25

现行

BS EN ISO 10058-2-2008

Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method)-Wet chemical analysis
菱镁矿和白云石耐火制品的化学分析（X射线荧光法的替代方法）

2009-01-31