MIL MIL-M-38510/52E Notice 1-Validation-微电路数字 CMOS NOR门单片硅正逻辑-国家数字标准馆

现行 MIL MIL-M-38510/52E Notice 1-Validation

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Microcircuits, Digital, CMOS, NOR Gates, Monolithic Silicon, Positive Logic 微电路数字 CMOS NOR门单片硅正逻辑

发布日期： 2009-09-18

本规范涵盖了单片硅、CMOS、逻辑微电路的详细要求。提供了两种产品保证等级和外壳轮廓、铅饰面和辐射硬度保证（RHA）的选择，并反映在完整的零件或识别号（PIN）中。对于该产品，MIL-M-38510的要求已被MIL-PRF-38535取代（见6.3）。

This specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance (RHA) are provided and are reflected in the complete Part or Identifying Number (PIN). For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 (see 6.3).

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发布单位或类别：美国-美国军事规范和标准

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