ISO/TR 18231:2016描述了可应用于波长色散X射线荧光（WD-XRF）光谱仪的测试方法，以确保光谱仪以允许进行精确分析的方式运行。 概述的测试旨在测量与光谱仪某些部件的操作相关的误差。它们的设计目的不是检查光谱仪的每个部分，而是只检查那些可能是常见误差源的部分。 假设仪器的性能已根据制造商的说明进行了优化。对于所有测试，应仔细设置被测线的两θ角。脉冲高度窗口应根据制造商的说明进行设置，并应具有广泛的设置，其中可能还包括气体比例计数器的逸出峰值。仪表和探测器的气体环境应符合制造商的规定，仪表的电源也应符合制造商的规定。 注:如果未进行区分，则假定试验适用于连续和同时光谱仪。

ISO/TR 18231:2016 describes methods of test that can be applied to wavelength dispersive X-ray fluorescence (WD-XRF) spectrometers to ensure that the spectrometers are functioning in a manner that allows precise analyses to be made. The tests outlined are designed to measure the errors associated with the operation of certain parts of the spectrometer. They are not designed to check every part of the spectrometer but only those parts that may be the common sources of error. It is assumed that the performance of the instrument has been optimized according to the manufacturer's instructions. For all tests, the two-theta angle should be carefully set for the line being measured. The pulse height window should be set according to the manufacturer's instructions and should have a broad setting which may also include the escape peak for gas proportional counters. The instrument and detector gas environment should be as specified by the manufacturer, as should the power supply to the instrument. NOTE Where no distinction has been made, it is assumed that a test is applicable to both sequential and simultaneous spectrometers.