现行

GOST 28381-89

Электромеханические компоненты для электронной аппаратуры. Основные методы испытаний и измерений
电子设备机电部件 基本测试程序和测量方法

现行

GB/T 5095.1-1997

电子设备用机电元件 基本试验规程及测量方法 第1部分:总则
Electromechanical components for electronic equipment--Basic testing procedures and measuringmethods--Part 1:General

1997-12-26

现行

UNE 20606-6-1986

ELECTROMECHANICAL COMPONENTS FOR ELECTRONIC EQUIPMENT; BASIC TESTING PROCEDURES AND MEASURING METHODS. CLIMATIC TESTS AND SOLDERING TESTS
电子设备用机电元件；基本测试程序和测量方法 气候试验和焊接试验

1986-11-15

现行

BS 5772-4-1979

Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods-Dynamic stress tests
电子设备用机电元件规范:基本试验程序和测量方法 动态应力测试

1979-11-30

现行

UNE-IEC 60512-9-2005

Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 9: Miscellaneous tests
电子设备用机电元件；基本试验程序和测量方法.第9部分:杂项试验

2005-05-18

现行

GB/T 5095.9-1997

电子设备用机电元件 基本试验规程及测量方法 第9部分:杂项试验
Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 9:Miscellaneous tests

1997-12-26

现行

GB/T 5095.11-1997

电子设备用机电元件 基本试验规程及测量方法 第11部分:气候试验
Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 11:Climatic tests

1997-12-26

现行

BS 5772-6-1984

Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods-Climatic tests and soldering tests
电子设备用机电元件规范:基本试验程序和测量方法 气候试验和焊接试验

1984-11-30

现行

BS 5772-3-1979

Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods-Current-carrying capacity tests
电子设备用机电元件规范:基本试验程序和测量方法 载流能力测试

1979-11-30

现行

GB/T 5095.4-1997

电子设备用机电元件 基本试验规程及测量方法 第4部分:动态应力试验
Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 4:Dynamic stress tests

1997-12-26

现行

BS EN 60512-14-7-1998

Electromechanical components for electronic equipment. Basic testing procedures and measuring methods. Sealing tests-Test 14g. Impacting water
电子设备用机电元件 基本测试程序和测量方法 密封测试 测试14g 冲击水

1998-05-15

现行

GB/T 5095.6-1997

电子设备用机电元件 基本试验规程及测量方法 第6部分:气候试验和锡焊试验
Electromechanical components for electronic equipment--Basic testing proceduresand measuring methods--Part 6:Climatic tests and soldering tests

1997-12-26

现行

DIN/IEC 60512-9

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 9: Miscellaneous Tests - GERMAN ONLY
电子设备用机电元件；基本测试程序和测量方法；第9部分:杂项测试-仅限德语

1994-05-01

现行

GB/T 5095.3-1997

电子设备用机电元件 基本试验规程及测量方法 第3部分:载流容量试验
Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 3:Current-carrying capacity tests

1997-12-26

现行

BS CECC 00009-1982

Harmonized system of quality assessment for electronic components. Basic specification: basic testing procedures and measuring methods for electromechanical components
电子元件质量评定协调体系 基本规范:机电元件的基本试验程序和测量方法

1982-04-30

现行

UNE 20606-8/2C-1983

ELECTROMECHANICAL COMPONENTS FOR ELECTRONIC EQUIPMENT; BASIC TESTING PROCEDURES AND MEASURING METHODS. CONNECTOR TEST (MECHANICAL) AND MECHANICAL TEST ON CONTACTS AND TERMINATIONS
电子设备用机电元件；基本测试程序和测量方法 连接器测试（机械）以及触点和终端的机械测试

1983-07-15

现行

KS C IEC 60512-7(2019 Confirm)

전자기기용 전기기계 부품 — 기본시험 절차 및 측정방법 — 제7부: 기계적 동작시험 및 봉합시험
电子设备机电组件 - 基本测试程序和测量方法 - 第7部分:机械操作测试和密封测试

2014-12-09

现行

KS C IEC 60512-7(2024 Confirm)

전자기기용 전기기계 부품 — 기본시험 절차 및 측정방법 — 제7부: 기계적 동작시험 및 봉합시험
电子设备用机电元件基本试验程序和测量方法第7部分:机械操作试验和密封试验

2014-12-09

现行

UNE 20606-8/1C-1982

ELECTROMECHANICAL COMPONENTS FOR ELECTRONIC EQUIPMENT; BASIC TESTING PROCEDURES AND MEASURING METHODS. CONNECTOR (MECHANICAL) TESTS AND MECHANICAL TESTS ON CONTACTS AND TERMINATIONS
电子设备用机电元件；基本测试程序和测量方法 连接器（机械）试验以及触点和终端的机械试验

1982-04-15

现行

UNE-IEC 60512-7-2005

Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests
电子设备用机电元件；基本试验程序和测量方法第7部分:机械操作试验和密封试验

2005-05-18