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现行 IEC 61967-2:2005
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method 集成电路 - 电磁辐射测量 150 Khz至1 Ghz - 第2部分:辐射辐射测量 - 温度计和宽带温度计方法
发布日期: 2005-09-29
本测试程序定义了一种测量集成电路(IC)电磁辐射的方法。被评估的IC安装在IC测试印刷电路板(PCB)上,该印刷电路板夹在横向电磁(TEM)或宽带千兆赫兹TEM(GTEM)单元顶部或底部切割的匹配端口(称为壁端口)上。测试板不像常规使用那样位于电池内部,而是成为电池壁的一部分。该方法适用于任何修改为包含壁孔的TEM或GTEM电池;然而,测量的射频(RF)电压将受到许多因素的影响。影响测量射频电压的主要因素是隔膜到IC测试板(电池壁)的间距。 该程序是使用1 GHz TEM电池开发的,该电池的隔板至地板间距为45 mm,而GTEM电池的隔板至地板平均间距为45 mm。 其他电池可能不会产生相同的光谱输出,但可用于比较测量,受其频率和灵敏度限制。转换系数可用于比较在具有不同隔板至地板间距的TEM或GTEM单元上测量的数据。 IC测试板控制操作IC相对于电池的几何形状和方向,并消除电池内的任何连接导线(这些导线位于电池外部的电路板背面)。对于TEM单元,50个端口中的一个端口端接50个负载。TEM单元的另一个50端口,或GTEM单元的单个50端口,连接到频谱分析仪或接收器的输入端,该分析仪或接收器测量集成电路发出的射频发射,并施加在单元的隔膜上。
This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a transverse electromagnetic (TEM) or wideband gigahertz TEM (GTEM) cell. The test board is not inside the cell, as in the conventional usage, but becomes a part of the cell wall. This method is applicable to any TEM or GTEM cell modified to incorporate the wall port; however, the measured radio frequency (RF) voltage will be affected by many factors. The primary factor affecting the measured RF voltage is the septum to IC test board (cell wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to floor spacing of 45 mm and a GTEM cell with average septum to floor spacing of 45 mm over the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations. A conversion factor may allow comparisons between data measured on TEM or GTEM cells with different septum to floor spacing. The IC test board controls the geometry and orientation of the operating IC relative to the cell and eliminates any connecting leads within the cell (these are on the backside of the board, which is outside the cell). For the TEM cell, one of the 50 ports is terminated with a 50 load. The other 50 port for a TEM cell, or the single 50 port for a GTEM cell, is connected to the input of a spectrum analyser or receiver that measures the RF emissions emanating from the integrated circuit and impressed onto the septum of the cell.
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归口单位: TC 47/SC 47A
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