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Techniques for Suspect/Counterfeit EEE Parts Detection by Electrical Test Methods 用电气测试方法检测可疑/假冒EEE零件的技术
发布日期: 2022-06-28
本文件的范围是:1。指定使用电气测试检测SC零件的技术。2.提供不同级别的电气测试,用户可以使用这些测试来定义检测SC零件的测试计划。3.提供测试实验室的最低要求,以便用户/请求者能够确定哪些测试机构具有必要的能力。(例如:为验证分析而进行电气测试的技术知识、设备、程序和协议。)注:用户/请求者在AS6171一般要求4中定义。指定老化和环境测试。环境测试包括有源器件的温度循环和无源器件的热冲击。对密封装置的密封试验进行了说明并提出了建议。
The scope of this document is to:1. Specify techniques to detect SC parts using electrical testing.2. Provide various levels of electrical testing that can be used by the User to define test plans for detecting SC parts.3. Provide minimum requirements for testing laboratories so that User/Requester can determine which test houses have the necessary capabilities. (For example: technical knowledge, equipment, procedures and protocols for performing electrical testing for verification analysis.) Note: User/Requester is defined in AS6171 General Requirements4. Specify Burn-In and environmental tests. The environmental tests include Temperature Cycling for Active Devices and Thermal Shock for Passive Devices. Seal Tests are described and recommended for hermetic devices.
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