现行

ISO/TR 19319-2013

Surface chemical analysis — Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
表面化学分析——基于波束的方法中确定横向分辨率和锐度的基本方法

2013-03-06

现行

AWWA WQTC65808

The Application of Electrochemical and Surface Analysis Approaches to Studying Copper Corrosion in Water: Fundamentals, Limitations and Examples
电化学和表面分析方法在研究水中铜腐蚀中的应用:基本原理、局限性和示例

2007-11-01

现行

ISO 24465-2023

Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device
表面化学分析.表面等离子体共振装置最小可检测性的测定

2023-01-10

现行

ISO/TR 18392-2005

Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
表面化学分析——X射线光电子能谱；确定背景的程序

2005-11-17

现行

GB/Z 32490-2016

表面化学分析 X射线光电子能谱 确定本底的程序
Surface chemical analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds

2016-02-24

现行

GB/T 39527-2020

实体面材产品中钙、铝、硅元素含量的测定 化学分析法
Determination of calcium, aluminium and silicon in the solid surface materials—Method of chemical analysis

2020-12-14

现行

BS ISO 11775-2015

Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
表面化学分析 扫描探针显微镜 悬臂梁法向弹簧常数的测定

2015-10-31

现行

ISO 11775-2015

Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
表面化学分析 - 扫描探针显微镜 - 悬臂弹簧常数的测定

2015-10-15

现行

GB/T 42543-2023

表面化学分析 扫描探针显微术 悬臂梁法向弹性常数的测定
Surface chemical analysis—Scanning probe microscopy—Determination of cantilever normal spring constants

2023-05-23

现行

BS ISO 14706-2014

Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
表面化学分析 全反射X射线荧光光谱法测定硅片表面元素污染

2014-07-31

现行

JIS K 0148-2005

Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
表面化学分析用全反射X射线荧光光谱法（TXRF）测定硅片表面元素污染

2005-01-01

现行

GB/T 40110-2021

表面化学分析 全反射X射线荧光光谱法（TXRF）测定硅片表面元素污染
Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

2021-05-21

现行

ISO 14706-2014

Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
表面化学分析 - 通过全反射X射线荧光（TXRF）光谱测定硅晶片上的表面元素污染

2014-07-25

现行

BS ISO 18516-2006

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率的测定

2006-11-30

现行

GB/T 28632-2012

表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率测定
Surface chemical analysis － Auger electron spectroscopy and X-ray photoelectron spectroscopy － Determination of lateral resolution

2012-07-31

现行

BS ISO 17331-2004+A1-2010

Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
表面化学分析 硅片工作标准物质表面元素收集的化学方法及其全反射X射线荧光光谱测定

2010-09-30

现行

GB/T 30701-2014

表面化学分析 硅片工作标准样品表面元素的化学收集方法和全反射X射线荧光光谱法（TXRF）测定
Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

2014-03-27

现行

ISO 17331-2004

Surface chemical analysis — Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
表面化学分析——硅片工作标准物质表面元素收集的化学方法及其全反射X射线荧光光谱测定

2004-05-18

现行

GB/T 6609.35-2023

氧化铝化学分析方法和物理性能测定方法 第35部分：比表面积的测定 氮吸附法
Chemical analysis methods and determination of physical performance of alumina—Part 35: Determination of specific surface area—Nitrogen adsorption method

2023-08-06

现行

BS ISO 11952-2019

Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
表面化学分析 扫描探针显微镜 用SPM测定几何量:测量系统的校准

2019-05-31