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现行 BS PD CLC IEC/TR 62271-307:2019
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High-voltage switchgear and controlgear-Guidance for the extension of validity of type tests of AC metal and solid-insulation enclosed switchgear and controlgear for rated voltages above 1 kV and up to and including 52 kV 高压开关设备和控制设备 额定电压1kV以上52kV及以下交流金属和固体绝缘封闭开关设备和控制设备型式试验有效期延长指南
发布日期: 2019-07-17
IEC 62271的本部分是一份技术报告,指IEC 62271-200和IEC 62271-201中规定的用于额定电压大于1kV,小于等于52kV的交流电的预制金属封闭和固体绝缘封闭(以下简称封闭)开关设备和控制设备组件,以及包含在同一外壳内的其他可能相互影响的设备。 本技术报告可用于将对一个具有规定额定值集的试验对象进行的型式试验的有效性扩展到具有不同额定值集或不同组件布置的同一系列的另一个开关设备组件。 它支持选择由开关设备和控制设备系列的功能单元组成的代表性试验对象,旨在优化型式试验,以便进行一致的合格评定。 本技术报告结合了良好的技术和物理原理、制造商和用户经验以及计算,为型式试验有效期的延长制定了指南,涵盖了各种设计和额定值方面。交叉引用: IEC 62271-200:2011EN 62271-1:2008/A1:2011EN 62271-200:2012EN 62271-1:2008IEC 60050-441:1984/AMD1:2000IEC 62271-201:2014IEC 62271-1:2007/AMD1:2011IEC 60050-441:1984EN 62271-201:2014IEC 62271-1:2007IEC 60865-1EN 60865-1IEC 60071-1:2006IEC 60071-1:2006/AMD1:2010EN 60071-1:20101:2019/2019年7月修订如下:
This Part of IEC 62271, which is a Technical Report, refers to prefabricated metal-enclosed and solid-insulation enclosed (both hereinafter called enclosed) switchgear and controlgear assemblies for alternating current of rated voltages above 1 kV and up to and including 52 kV as specified in IEC 62271-200 and IEC 62271-201, and to other equipment included in the same enclosure with any possible mutual influence. This Technical Report may be used for the extension of the validity of type tests performed on one test object with a defined set of ratings to another switchgear assembly of the same family with a different set of ratings or different arrangements of components. It supports the selection of representative test objects composed of functional units of a family of switchgear and controlgear aimed at the optimization of type tests in order to perform a consistent conformity assessment. This Technical Report utilises a combination of sound technical and physical principles, manufacturer and user experience and calculations to establish guidance for the extension of validity of type tests, covering various design and rating aspects.Cross References:IEC 62271-200:2011EN 62271-1:2008/A1:2011EN 62271-200:2012EN 62271-1:2008IEC 60050-441:1984/AMD1:2000IEC 62271-201:2014IEC 62271-1:2007/AMD1:2011IEC 60050-441:1984EN 62271-201:2014IEC 62271-1:2007IEC 60865-1EN 60865-1IEC 60071-1:2006IEC 60071-1:2006/AMD1:2010EN 60071-1:2006EN 60071-1:2006/A1:2010Incorporates the following:Corrigendum, July 2019
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发布单位或类别: 英国-英国标准学会
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