现行

BS EN IEC 61967-1-2019

Integrated circuits. Measurement of electromagnetic emissions-General conditions and definitions
集成电路 电磁辐射的测量 一般条件和定义

2019-02-21

现行

BS EN 62132-1-2016

Integrated circuits. Measurement of electromagnetic immunity-General conditions and definitions
集成电路 电磁抗扰度的测量

2016-03-31

现行

SAE J1752/1_202109

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions (Stabilized: Sep 2021)
集成电路电磁兼容性测量程序集成电路EMC测量程序总则和定义

2021-09-21

现行

DIN IEC 61967-8-DRAFT

Draft Document - Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC Stripline method (IEC 47A/810/CD:2009)
文件草案——集成电路——电磁发射测量——第8部分:辐射发射测量——IC带状线法（IEC 47A/810/CD:2009）

2009-05-01

现行

DIN IEC 62132-8-DRAFT

Draft Document - Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method (IEC 47A/811/CD:2009)
文件草案——集成电路——电磁抗扰度测量——第8部分:辐射抗扰度测量——IC带状线法（IEC 47A/811/CD:2009）

2009-05-01

现行

BS EN 62132-8-2012

Integrated circuits. Measurement of electromagnetic immunity-Measurement of radiated immunity. IC stripline method
集成电路 电磁抗扰度的测量

2012-10-31

现行

IEC 61967-1-2018 RLV

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
集成电路.电磁辐射的测量.第1部分:一般条件和定义

2018-12-12

现行

IEC 61967-1-2018

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
集成电路电磁辐射测量第1部分:一般条件和定义

2018-12-12

现行

IEC 62132-1-2015

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
集成电路 - 电磁抗扰度测量 - 第1部分:一般条件和定义

2015-10-29

现行

GB/T 42968.1-2023

集成电路 电磁抗扰度测量 第1部分：通用条件和定义
Integrated circuits—Measurement of electromagnetic immunity—Part 1: General conditions and definitions

2023-09-07

现行

DIN EN 62132-6-DRAFT

Draft Document - Integrated circuits - Measurement of electromagnetic immunity - Part 6: Local Injection Horn Antenna (LIHA) method (IEC 47A/862/CD:2010)
文件草稿-集成电路-电磁抗扰度测量-第6部分:局部注入喇叭天线（LIHA）法（IEC 47A/862/CD:2010）

2011-03-01

现行

SJ 21147.1-2016

军用集成电路电磁发射测量方法 第1部分：通用条件和定义
Measurement of electromagnetic emissions for military integrated circuits - Part 1:General conditions and definitions

2016-01-19

现行

IEC TS 62132-9-2014

Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
集成电路电磁抗扰度测量第9部分:辐射抗扰度测量表面扫描法

2014-08-21

现行

IEC 62132-8-2012

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
集成电路 - 电磁抗扰度测量 - 第8部分:辐射抗扰度测量 - IC带状线法

2012-07-06

现行

IEC TS 61967-3-2014

Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
集成电路.电磁发射的测量.第3部分:辐射发射的测量.表面扫描法

2014-08-25

现行

IEC 61967-8-2023 RLV

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法

2023-05-03

现行

IEC 61967-8-2023

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法

2023-05-03

现行

GB/T 42968.8-2023

集成电路 电磁抗扰度测量 第8部分：辐射抗扰度测量 IC带状线法
Integrated circuits—Measurement of electromagnetic immunity—Part 8: Measurement of radiated immunity—IC stripline method

2023-09-07

现行

SJ 21147.3-2016

军用集成电路电磁发射测量方法 第3部分：辐射发射测量-表面扫描法
Measurement of electromagnetic emissions for military integrated circuits - Part 3:Measurement of radiated emissions - Surface scan method

2016-01-19

现行

BS EN 62132-2-2011

Integrated circuits. Measurement of electromagnetic immunity-Measurement of radiated immunity. TEM cell and wideband TEM cell method
集成电路 电磁抗扰度的测量

2011-04-30