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现行 ASTM B667-97(2024)
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Standard Practice for Construction and Use of a Probe for Measuring Electrical Contact Resistance 测量电接触电阻用探针的结构和使用的标准实施规程
发布日期: 2024-11-01
1.1 本实施例描述了用探头测量电接触电阻的设备和技术以及结果的呈现。 1.2 以SI单位表示的值将被视为标准值。本标准不包括其他计量单位。 1.3 本标准并不旨在解决与其使用相关的所有安全性问题(如果有)。本标准的使用者有责任熟悉所有危害,包括制造商提供的本产品/材料的适当材料安全数据表(MSDS)中确定的危害,建立适当的安全、健康和环境实践,并在使用前确定法规限制的适用性。 1.4 本国际标准是根据th发布的关于制定国际标准、指南和建议的原则的决定中确立的国际公认的标准化原则制定的e世界贸易组织技术性贸易壁垒委员会。 ======意义和用途====== 4.1 电接触电阻是某些部件(如连接器、开关、滑环和继电器)中触点的重要特性。通常,接触电阻要求低且稳定,以使其中使用该部件的许多装置或设备正常运行。为了测量的目的,用探针确定接触电阻比将接触材料结合到实际部件中更方便。然而,如果探针接触材料与部件中使用的材料不同,则获得的结果可能不适用于设备。 4.2 关于接触电阻的信息在材料开发、失效分析研究、接触装置的制造和质量控制以及研究中是有用的。4.3 接触电阻不是材料唯一的单值属性。它受接触的机械条件、接触表面的几何形状和粗糙度、表面清洁度和接触历史以及两个接触构件的硬度和导电性的材料特性的影响。该实践的目的是以这样的方式定义和控制许多已知变量,使得可以对材料的接触特性进行有效的比较。 4.4 在用于测量接触电阻的一些技术中,不可能消除体电阻,即包括接触的金属片的电阻以及用于将测试电流引入样品中的导线和连接的电阻。在这些情况下,测量实际上是总电阻,其经常与接触电阻混淆。
1.1 This practice describes equipment and techniques for measuring electrical contact resistance with a probe and the presentation of results. 1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to become familiar with all hazards including those identified in the appropriate Material Safety Data Sheet (MSDS) for this product/material as provided by the manufacturer, to establish appropriate safety, health, and environmental practices, and determine the applicability of regulatory limitations prior to use. 1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 4.1 Electrical contact resistance is an important characteristic of the contact in certain components, such as connectors, switches, slip rings, and relays. Ordinarily, contact resistance is required to be low and stable for proper functioning of many devices or apparatus in which the component is used. It is more convenient to determine contact resistance with a probe than to incorporate the contact material into an actual component for the purpose of measurement. However, if the probe contact material is different from that employed in the component, the results obtained may not be applicable to the device. 4.2 Information on contact resistance is useful in materials development, in failure analysis studies, in the manufacturing and quality control of contact devices, and in research. 4.3 Contact resistance is not a unique single-valued property of a material. It is affected by the mechanical conditions of the contact, the geometry and roughness of contacting surfaces, surface cleanliness, and contact history, as well as by the material properties of hardness and conductivity of both contacting members. An objective of this practice is to define and control many of the known variables in such a way that valid comparisons of the contact properties of materials can be made. 4.4 In some techniques for measuring contact resistance it is not possible to eliminate bulk resistance, that is, the resistance of the metal pieces comprising the contact and the resistance of the wires and connections used to introduce the test current into the samples. In these cases, the measurement is actually of an overall resistance, which is often confused with contact resistance.
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归口单位: B02.05
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