本试验方法标准MIL-STD-750-3的第3部分建立了半导体晶体管电气试验的统一试验方法，以确定对自然元素和军事行动周围条件有害影响的耐受性。在本标准中，术语“设备”包括晶体管、二极管、电压调节器、整流器、隧道二极管和其他相关部件。多部分试验方法标准的这一部分仅适用于半导体器件。

Part 3 of this test method standard MIL-STD-750-3 establishes uniform test methods for the electrical testing of semiconductor transistors to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.