IEC 61967-1:20 18作为IEC 61967-1:20 18 RLV提供，其中包含国际标准及其红线版本，显示了与上一版本相比技术内容的所有变化。IEC 61967-1:20 18提供了集成电路传导和辐射电磁干扰测量的一般信息和定义。它还提供了测量条件、测试设备和设置以及测试程序和测试报告内容的描述。附件A中包含了测试方法比较表，以帮助选择适当的测量方法。本文件的目的是描述一般条件，以便建立统一的测试环境并获得来自集成电路（IC）的RF干扰的定量测量。描述了预期影响测试结果的关键参数。与本文件的偏差在单个测试报告中明确注明。测量结果可以用于比较或其他目的。在受控条件下来自集成电路的传导RF发射或辐射RF干扰的电压和电流的测量产生关于集成电路应用中RF干扰的可能性的信息。适用的频率范围在IEC 61967的每个部分中都有描述。 与上一版相比，此版本包括以下重大技术变更: -从标题中删除了150 kHz至1 GHz的频率范围； -在表1、表2和5.4中增加了高于1GHz的频率步长； -表A.1已分为两个表，IEC 61967-8已添加到附件A的表A.2中； -通用测试板描述已移至附录D。

IEC 61967-1:2018 is available as IEC 61967-1:2018 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61967-1:2018 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. Test method comparison tables are include in Annex A to assist in selecting the appropriate measurement method(s). The object of this document is to describe general conditions in order to establish a uniform testing environment and to obtain a quantitative measure of RF disturbances from integrated circuits (IC). Critical parameters that are expected to influence the test results are described. Deviations from this document are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit. The applicable frequency range is described in each part of IEC 61967.
This edition includes the following significant technical changes with respect to the previous edition:
- the frequency range of 150 kHz to 1 GHz has been deleted from the title;
- the frequency step above 1 GHz has been added to Table 1, Table 2 and to 5.4;
- Table A.1 has been divided into two tables, and IEC 61967-8 has been added to Table A.2 of Annex A;
- the general test board description has been moved to Annex D.