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现行 ISO 10110-7:2017
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Optics and photonics — Preparation of drawings for optical elements and systems — Part 7: Surface imperfections 光学和光子学 - 准备光学元件和系统的图纸 - 第7部分:表面缺陷
发布日期: 2017-08-16
ISO 10110(所有零件)规定了单个光学元件和光学组件的设计和功能要求在用于制造和检验的技术图纸中的表示。 ISO 10110-7:2017规定了单个光学元件和光学组件测试区域内表面缺陷可接受程度的指示。这些缺陷包括局部表面缺陷、边缘缺口和长划痕。 规定了缺陷的可接受水平,并考虑了功能效应(影响光学元件的成像或耐久性)以及外观效应。 ISO 10110-7:2017适用于成品光学元件的透射和反射表面,无论其是否有涂层,以及光学组件。它允许根据部件或光学组件上受缺陷影响的区域或缺陷可见度规定允许的缺陷。
ISO 10110 (all parts) specifies the presentation of design and functional requirements for single optical elements and for optical assemblies in technical drawings used for their manufacture and inspection. ISO 10110-7:2017 specifies the indication of the level of acceptability of surface imperfections within a test region on individual optical elements and optical assemblies. These include localized surface imperfections, edge chips and long scratches. The acceptance level for imperfections is specified, taking into account functional effects (affecting image formation or durability of the optical element), as well as cosmetic (appearance) effects. ISO 10110-7:2017 applies to transmitting and reflecting surfaces of finished optical elements, whether or not they are coated, and to optical assemblies. It allows permissible imperfections to be specified according to the area affected by imperfections, or alternatively by the visibility of imperfections, on components or in optical assemblies.
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归口单位: ISO/TC 172/SC 1
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