IEC TS 63342:2022旨在通过在较高温度下施加电流来评估高温下光诱导降解(LETID)的影响。在本文中，仅讨论了用于检测LETID的当前注射方法。 该文件没有解决B-O和铁硼（Fe-B）相关的降解现象，这些现象已经在室温下在光存在下以更快的时间尺度发生。提议的测试程序可以揭示样品对LETID降解机制的敏感性，但它不能提供现场可观察降解的精确测量。

IEC TS 63342:2022 is designed to assess the effect of light induced degradation at elevated temperatures (LETID) by application of electrical current at higher temperatures. In this document, only the current injection approach for the detection of LETID is addressed.
This document does not address the B-O and Iron Boron (Fe-B) related degradation phenomena, which already occur at room temperatures under the presence of light and on much faster time scales. The proposed test procedure can reveal sample sensitivity to LETID degradation mechanisms, but it does not provide an exact measure of field observable degradation.