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现行 IEC TS 62876-2-1:2018
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Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test 纳米技术可靠性评估第2-1部分:纳米光伏器件稳定性试验
发布日期: 2018-08-29
IEC TS 62876-2-1:2018建立了通用稳定性测试计划,以验证纳米材料和纳米光伏器件(NePV)性能的稳定性。这些设备作为组件,通过与其他组件的组合来制造光伏组件。该测试计划定义了技术的标准化降解条件、方法和数据评估。这些测试的结果定义了标准化降解条件下的稳定性,用于定量评估新技术的稳定性。本文件中概述的程序是为NePV设计的,但也可以扩展为其他光伏技术的指南。
IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.
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归口单位: TC 113
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