BS EN 61967-5:2003-集成电路电磁辐射测量 150 kHz至1 GHz-国家数字标准馆

现行 BS EN 61967-5:2003

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Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of conducted emissions. Workbench Faraday Cage method 集成电路电磁辐射测量 150 kHz至1 GHz

发布日期： 2003-06-17

结合参考文献阅读。STD 285CISPR 16-1:1999CISPR 16-2:1996IEC 61967-2IEC/TS 61967-3IEC 61967-4IEC 61967-6IEC 60050-131:2002IEC 60050-161:1990IEC 61967-1:2002IEC 61000-4-6:1996EN 61967-1:2002EN 61000-4-6:1996

To be read in conjunction with BS EN 61967-1:2002Cross References:MIL.STD 285CISPR 16-1:1999CISPR 16-2:1996IEC 61967-2IEC/TS 61967-3IEC 61967-4IEC 61967-6IEC 60050-131:2002IEC 60050-161:1990IEC 61967-1:2002IEC 61000-4-6:1996EN 61967-1:2002EN 61000-4-6:1996

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发布单位或类别：英国-英国标准学会

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IEC 61967-6-2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
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IEC 61967-6-2002+AMD1-2008 CSV

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
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BS EN 61967-2-2005

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KS C IEC 61967-4(2019 Confirm)

집적 회로－150 kHz에서 1 GHz의 전기 자기 장해 측정－제4부：전도 장해 측정－1 W/150 W 직접 결합 방법
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IEC 61967-6-2002/AMD1-2008

Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
修改件1.集成电路.150 kHz至1 GHz电磁发射的测量.第6部分:传导发射的测量.磁探针法

IEC 61967-2-2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
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BS EN 62132-5-2006

Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz-Workbench Faraday cage method
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BS EN IEC 61967-4-2021

Integrated circuits. Measurement of electromagnetic emissions-Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method
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BS EN 62132-4-2006

Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz-Direct RF power injection method
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BS EN 62132-3-2007

Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz-Bulk current injection (BCI) method
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IEC TR 61967-4-1-2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4
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Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
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IEC 61967-4-2021 RLV

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
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IEC 61967-4-2021

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
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IEC 62132-4-2006

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions; Workbench Faraday Cage method (IEC 61967-5:2003); German version EN 61967-5:2003
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