BS 05/30137850 DC-IEC 62215-2 集成电路脉冲抗扰度的测量第二部分脉冲注入法-国家数字标准馆

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IEC 62215-2. Integrated circuits. Measurement of impulse immunity. Part 2. Impulse injection method IEC 62215-2 集成电路脉冲抗扰度的测量第二部分脉冲注入法

发布日期： 2005-08-10

交叉引用:IEC 60050-131IEC 60050-161IEC 61000-4-2IEC 61000-4-4IEC 61967-4IEC 62132-4购买时可用的所有当前修订版均包含在本文件的购买中。

Cross References:IEC 60050-131IEC 60050-161IEC 61000-4-2IEC 61000-4-4IEC 61967-4IEC 62132-4All current amendments available at time of purchase are included with the purchase of this document.

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发布单位或类别：英国-英国标准学会

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相似标准/计划/法规

现行

DIN EN 62215-3

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (IEC 62215-3:2013); German version EN 62215-3:2013
集成电路.脉冲抗扰度测量.第3部分:非同步瞬态注入法（IEC 62215-3-2013）；德文版EN 62215-3:2013

2014-04-01

现行

BS 10/30209944 DC

BS EN 62215-3. Integrated circuits. Measurement of impulse immunity. Part 3. Non-synchronous transient injection method
英国标准EN 62215-3 集成电路脉冲抗扰度的测量第三部分非同步瞬态注入法

2010-02-08

现行

IEC TS 62215-2-2007

Integrated circuits - Measurement of impulse immunity - Part 2: Synchronous transient injection method
集成电路脉冲抗扰度测量第2部分:同步瞬态注入法

2007-09-10

现行

GB/T 43034.2-2024

集成电路脉冲抗扰度测量第2部分: 同步瞬态注入法
Integrated circuits—Measurement of impulse immunity—Part 2: Synchronous transient injection method

2024-10-26

现行

DIN IEC 62215-3-DRAFT

Draft Document - Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (IEC 47A/839/CD:2010)
文件草案.集成电路.脉冲抗扰度测量.第3部分:非同步瞬态注入法（IEC 47A/839/CD:2010）

2010-05-01

现行

DIN EN 62132-2

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010); German version EN 62132-2:2011
集成电路.电磁抗扰度测量.第2部分:辐射抗扰度测量.TEM室和宽带TEM室法（IEC 62132-2-2010）；德文版EN 62132-2:2011

2011-07-01

现行

BS 06/30151320 DC

BS IEC 62132-2. Integrated Circuits, Measurement of Electro magnetic Immunity, 150 kHz to 1 GHz. Part 2. Measurement of Radiated Immunity Tem-Cell and Wideband Tem-Cell Method
BS IEC 62132-2 集成电路电磁抗扰度的测量 150kHz至1GHz 第二部分辐射抗扰度的测量Tem室法和宽带Tem室法

2006-06-09

现行

DIN IEC 62132-2-DRAFT

Draft Document - Integrated Circuits - Measurement of Electromagnetic Immunity, 150 kHz to 1 GHz - Part 2: Measurement of Radiated Immunity - Tem-Cell and Wideband Tem-Cell Method (IEC 47A/748/CD:2006)
文件草稿.集成电路.150 kHz至1 GHz电磁抗扰度的测量.第2部分:辐射抗扰度的测量.Tem室和宽带Tem室法（IEC 47A/748/CD:2006）

2006-08-01