适用于雪崩击穿二极管（ABD），它代表一种浪涌保护装置组件（以下简称SPDC），用于设计和建造连接到低压配电系统、传输和信号网络的浪涌保护装置。本标准中的测试规范适用于由两个端子组成的单ABD。然而，多个ABD可以组装在定义为二极管阵列的单个封装中。阵列中的每个二极管都可以按照此规格进行测试。 本标准包含一系列用于确定ABD电气特性的试验标准。根据本文所述的标准试验方法，可以验证或确定ABD的性能特征和额定值，以用于特定的包装设计。

Is applicable to avalanche breakdown diodes (ABDs) which represent one type of surge protective device component (hereinafter referred to as SPDC) used in the design and construction of surge protective devices connected to low-voltage power distribution systems, transmission, and signalling networks. Test specifications in this standard are for single ABDs consisting of two terminals. However, multiple ABDs may be assembled within a single package defined as a diode array. Each diode within the array can be tested to this specification. This standard contains a series of test criteria for determining the electrical characteristics of the ABD. From the standard test methods described herein, the performance characteristics and ratings of the ABD can be verified or established for specific packaged designs.