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现行 ISO 27448:2009
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Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for self-cleaning performance of semiconducting photocatalytic materials — Measurement of water contact angle 精细陶瓷(高级陶瓷、高级工业陶瓷)——半导体光催化材料自清洁性能的试验方法——水接触角的测量
发布日期: 2009-07-02
ISO 27448:2009涉及精细陶瓷。 ISO 27448:2009规定了一种测试方法,用于测定含有光催化剂或表面有光催化膜的材料的自清洁性能,这些材料通常由半导体金属氧化物(如二氧化钛)制成。 该方法用于测量紫外光照射下的水接触角,这是影响光催化材料自清洁性能的指标之一。 ISO 27448: 2009不包括透水性基底、没有暴露水滴的粗糙表面、高度疏水性、粉末或颗粒材料,或可见光敏感光催化剂。
ISO 27448:2009 deals with fine ceramics. ISO 27448:2009 specifies a test method for the determination of the self-cleaning performance of materials that contain a photocatalyst or have photocatalytic films on the surface, and which are usually made from semiconducting metal oxides such as titanium dioxide. This method is used to measure the water contact angle under illumination with ultraviolet light, which is one of the indices influencing the self-cleaning performance of photocatalytic materials. ISO 27448:2009 does not include water-permeable substrates, rough surfaces which do not have exposed water droplets, highly hydrophobic, powder or granular materials, or visible light-sensitive photocatalysts.
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归口单位: ISO/TC 206
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