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现行 IEEE 1687-2014
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IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device IEEE半导体设备中嵌入式仪表的访问和控制标准
发布日期: 2014-12-05
本标准制定了通过IEEE 1149.1(TM)测试访问端口(TAP)和可能需要的附加信号访问嵌入式仪器的方法,而无需定义仪器或其功能本身。该方法的要素包括一种描述语言,用于描述特征的特征和与特征的通信,以及与特征的接口要求。
This standard develops a methodology for access to embedded instrumentation, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and additional signals that may be required. The elements of the methodology include a description language for the characteristics of the features and for communication with the features, and requirements for interfacing to the features.
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