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Semiconductor devices-Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes 半导体器件
发布日期: 2019-11-27
IEC 60747的本部分规定了无荧光粉的单个发光二极管(LED)芯片或封装的各种效率的术语和测量方法。照明应用的白色LED不在IEC 60747本部分的范围内。本部分定义的测量方法包括功率效率(PE)、外部量子效率(EQE)、电压效率(VE)和光提取效率(LEE)。为了测量LEE,使用了内部量子效率(IQE)的测量数据,其测量方法在IEC 60747-5-91和IEC 60747-5-102中进行了讨论。注入效率(IE)和辐射效率(RE)仅给出定义。交叉引用:IEC 60747-5-6:2016IEC 60747-5-9IEC 60050-845IEC 60747-5-10购买时可用的所有现行修订版均包含在本文件的购买中。
This part of IEC 60747 specifies the terminology and the measuring methods of various efficiencies of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this part of IEC 60747. The efficiencies whose measuring methods are defined in this part are the power efficiency (PE), the external quantum efficiency (EQE), the voltage efficiency (VE), and the light extraction efficiency (LEE). To measure the LEE, the measurement data of the internal quantum efficiency (IQE) is used, whose measuring method is discussed in IEC 60747-5-91and IEC 60747-5-102. The injection efficiency (IE) and the radiative efficiency (RE) are given definitions only.Cross References:IEC 60747-5-6:2016IEC 60747-5-9IEC 60050-845IEC 60747-5-10All current amendments available at time of purchase are included with the purchase of this document.
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发布单位或类别: 英国-英国标准学会
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