1.1 本试验方法包括测定电线和电缆的挤压交联和热塑性半导体、导体和绝缘屏蔽体的体积电阻率的程序，纵向测量。 1.2 在通常的实践中，导体屏蔽通常被称为绞线屏蔽。 1.3 从技术上讲，这种测试方法是测量单个表面上两个电极之间的电阻，并使用试样几何形状的尺寸修改该值以计算电阻率。然而，试样的几何形状支持电流路径的假设，该电流路径主要贯穿电极之间材料的体积，从而证明使用术语“纵向体积电阻率”是合理的。 ”（见3.1.2.1。） 1.4 无论何时以不同的单位显示两组值，第一组中的值都是标准值，而括号中的值仅供参考。 1.5 本标准并非旨在解决与其使用相关的所有安全问题（如有）。本标准的使用者有责任在使用前制定适当的安全、健康和环境实践，并确定监管限制的适用性。 有关具体的危险说明，请参阅 7.1 . 1.6 本国际标准是根据世界贸易组织技术性贸易壁垒委员会发布的《关于制定国际标准、指南和建议的原则的决定》中确立的国际公认的标准化原则制定的。 ====意义和用途====== 4.1 半导体挤压屏蔽材料的电气性能由于各种原因而很重要，例如安全性、静电和电流传输。该测试方法可用于预测此类半导体化合物的行为。另请参见测试方法 第4496天 .

1.1 This test method covers the procedure for determining the volume resistivity, measured longitudinally, of extruded crosslinked and thermoplastic semiconducting, conductor and insulation shields for wire and cable. 1.2 In common practice the conductor shield is often referred to as the strand shield. 1.3 Technically, this test method is the measurement of a resistance between two electrodes on a single surface and modifying that value using dimensions of the specimen geometry to calculate a resistivity. However, the geometry of the specimen is such as to support the assumption of a current path primarily throughout the volume of the material between the electrodes, thus justifying the use of the term “longitudinal volume resistivity.” (See 3.1.2.1.) 1.4 Whenever two sets of values are presented, in different units, the values in the first set are the standard, while those in parentheses are for information only. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. For a specific hazard statement, see 7.1 . 1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 4.1 The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety, static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds. Also see Test Method D4496 .