BS EN ISO 16371-2:2017规定了计算机射线照相的基本技术，旨在 经济上可获得令人满意且可重复的结果。这些技术基于 本课程的基本理论和测试方法。本文件规定了一般规则 用于工业计算X射线和伽马射线探伤，使用存储 荧光成像板（IP）。它基于射线照相检查的一般原则 ISO 5579中规定的以薄膜为基础的金属材料。辐射源的基本设置， 探测器和相应的几何结构应按照ISO 5579和 相应的产品标准，如ISO 17636焊接标准和EN 12681铸造标准。交叉引用:ISO 16371-1:2011ISO 19232-2:2013 ED2EN 12679:1999ISO 5579:2013 ED3ISO 19232-3:2013 ED2EN 12543ISO 9712:2012ISO 19232-5:2013 ED2ISO 5580:1985（R11）ISO 19232-1:2013 ED2EN 16407ASTM E2445/E2445M- 14ISO 17636-2:2013 ED1ASTM E2033-99（2013）ASTM E2446-16ASTM E2002-15EN 12681:2003ISO 17636-1:2013 ED1ISO 19232-4:2013 ED2ASTM E2007-10（2016）购买本文件时，包括所有当前可用的修订。

BS EN ISO 16371-2:2017 specifies fundamental techniques of computed radiography with the aim of enabling satisfactory and repeatable results to be obtained economically. The techniques are based on the fundamental theory of the subject and tests measurements. This document specifies the general rules for industrial computed X-rays and gamma radiography for flaw detection purposes, using storage phosphor imaging plates (IP). It is based on the general principles for radiographic examination of metallic materials on the basis of films, as specified in ISO 5579. The basic set-up of radiation source, detector and the corresponding geometry are intended to be applied in accordance with ISO 5579 and corresponding product standards such as ISO 17636 for welding and EN 12681 for foundry.Cross References:ISO 16371-1:2011ISO 19232-2:2013 ED2EN 12679:1999ISO 5579:2013 ED3ISO 19232-3:2013 ED2EN 12543ISO 9712:2012ISO 19232-5:2013 ED2ISO 5580:1985 (R11)ISO 19232-1:2013 ED2EN 16407ASTM E2445/E2445M - 14ISO 17636-2:2013 ED1ASTM E2033 - 99(2013)ASTM E2446 - 16ASTM E2002 - 15EN 12681:2003ISO 17636-1:2013 ED1ISO 19232-4:2013 ED2ASTM E2007 - 10(2016)All current amendments available at time of purchase are included with the purchase of this document.