本标准描述了小信号VHF-UHF晶体管导纳参数测量方法，用于编制低功率晶体管JEDEC注册数据表。以前称为RS-372和/或EIA-372。

This standard describes the method to be used for the measurement of small-signal VHF-UHF transistor admittance parameters, in preparing data sheets for JEDEC registration of low power transistors. Formerly known as RS-372 and/or EIA-372.