IEC 61967-6:2002-集成电路 - 电磁辐射测量 150赫兹至1 Ghz - 第6部分:传导发射测量 - 磁探针法-国家数字标准馆

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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method 集成电路 - 电磁辐射测量 150赫兹至1 Ghz - 第6部分:传导发射测量 - 磁探针法

发布日期： 2002-06-25

规定了一种通过使用微型磁探针进行非接触电流测量来评估集成电路（IC）引脚上射频电流的方法。该方法能够测量IC在0.15 MHz至1000 MHz频率范围内产生的射频电流。
本副本包含2010年8月勘误表的内容。

Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz.
The contents of the corrigendum of August 2010 have been included in this copy.

分类信息

发布单位或类别：国际组织-国际电工委员会

ICS分类： 31.200电子学 - 集成电路、微电子学

关联关系

研制信息

归口单位： TC 47/SC 47A

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