本文件提供了描述单片陶瓷介质电容器内部结构特征的术语、方法和标准。其主要目标是准确评估片式电容器元件的内部物理质量，因为这与成品电容器的功能可靠性有关。本标准还提供了与破坏性物理分析（DPA）相关的活动所需的有用信息，如脱封后目视检查和DPA报告。 此外，它还为DPA采样处理中固有的问题提供了教程帮助。

This document provides terminology, methods, and criteria for characterizing the internal structural features of monolithic, ceramic dielectric capacitors. Its major objective is the accurate evaluation of the internal physical quality of the chip capacitor element as it relates to the functional reliability of the finished capacitor. This standard also provides needed and useful information pertaining to activities associated with destructive physical analysis (DPA), such as post-decapsulation visual inspection and DPA reporting. In addition, it provides tutorial help for problems inherent in DPA sampling processing.