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现行 KS C IEC 62321-5-2014(2024)
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전기전자 제품에서 특정 물질의 정량 — 제5부: AAS, AFS, ICP-OES 또는 ICP-MS에 의한 폴리머와 전기전자 부품에서 카드뮴과 납 및 크로뮴의 분석과 금속에서 카드뮴과 납의 분석 电工产品中某些物质的测定第5部分:聚合物和电子产品中的镉、铅和铬
发布日期: 2014-12-24
KS C IEC62321第5部分介绍如何使用AAS、AFS、ICP-OES、ICP-MS测试聚合物、金属和电子元器件内铅、镉和铬。
KS C IEC 62321 제5부는 AAS, AFS, ICP-OES, ICP-MS를 사용하여 폴리머, 금속 및 전기전자 부품 내 납과 카드뮴 및 크로뮴을 시험하는 방법에 대해 설명한다.
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发布单位或类别: 韩国-韩国标准
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