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现行 IEC 62047-11:2013
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Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems 半导体器件 - 微机电器件 - 第11部分:用于微机电系统的自由立体材料的线性热膨胀系数的测试方法
发布日期: 2013-07-17
IEC 62047-11:2013规定了测量长度在0.1 mm和1 mm之间、宽度在10微米和1 mm之间、厚度在0.1微米和1 mm之间的薄独立固体(金属、陶瓷、聚合物等)微机电系统(MEMS)材料线性热膨胀系数(CLTE)的试验方法,这些材料是用于MEMS的主要结构材料,微机械和其他。本试验方法适用于室温至材料熔融温度30%范围内的CLTE测量。
IEC 62047-11:2013 specifies the test method to measure the linear thermal expansion coefficients (CLTE) of thin free-standing solid (metallic, ceramic, polymeric, etc.) micro-electro-mechanical system (MEMS) materials with length between 0,1 mm and 1 mm and width between 10 micrometre and 1 mm and thickness between 0,1 micrometre and 1 mm, which are main structural materials used for MEMS, micromachines and others. This test method is applicable for the CLTE measurement in the temperature range from room temperature to 30 % of a material's melting temperature.
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归口单位: TC 47/SC 47F
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