BS EN ISO 18563-2:2017规定了在制造阶段性组件结束时进行的特性测试 阵列探测器。它定义了方法和验收标准。本文件适用于以下用于超声波无损检测的相控阵探头 接触法（带或不带楔块）或浸没法（带中心 频率范围为0.5 MHz至10 MHz:a）非矩阵阵列探头:线性；包围；部分环形扇形（雏菊型）；b） 2D矩阵阵列探头。本文件未给出描述设备性能的方法和验收标准 超声波相控阵仪器或组合系统的性能。这些都在 ISO 18563？1和ISO 18563？3.交叉引用:EN 16018:2011ISO 2400:2012ISO 5577:2017ISO 18563-1:2015ISO 18563-3:2015购买本文件时可获得的所有现行修订均包含在购买本文件中。

BS EN ISO 18563-2:2017 specifies the characterization tests performed at the end of the fabrication of a phased array probe. It defines both methodology and acceptance criteria.This document is applicable to the following phased array probes used for ultrasonic non-destructive testing in contact technique (with or without a wedge) or in immersion technique, with centre frequencies in the range 0,5 MHz to 10 MHz:a) non-matrix array probes:linear;encircling;partial annular sectorial (type "daisy");b) 2D-matrix array probes.This document does not give methods and acceptance criteria to characterize the performance of an ultrasonic phased array instrument or the performance of a combined system. These are given in ISO 18563?1 and in ISO 18563?3.Cross References:EN 16018:2011ISO 2400:2012ISO 5577:2017ISO 18563-1:2015ISO 18563-3:2015All current amendments available at time of purchase are included with the purchase of this document.