Draft Document - Testing of ceramic raw and finished materials - Part 2: Sampling of ceramic raw materials
文件草案.陶瓷原材料和成品的试验.第2部分:陶瓷原材料的取样

2015-06-01

Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation
陶瓷原材料和基础材料的试验.直流电弧激发OES法直接测定碳化硅粉末和颗粒中杂质的质量分数

2011-04-01

Testing of ceramic raw and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation
陶瓷原材料和基本材料的测试 直流电弧激发OES法直接测定碳化硅粉末和颗粒中杂质的质量分数

2011-02-28

BS EN 15979. Testing of ceramic raw and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation
英国标准EN 15979 陶瓷原材料和基本材料的测试 直流电弧激发OES法直接测定碳化硅粉末和颗粒中杂质的质量分数

2009-08-05

Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) and electrothermal vaporisation (ETV)
陶瓷原材料和基础材料的试验.用电感耦合等离子体发射光谱法（ICP OES）和电热蒸发法（ETV）直接测定碳化硅粉末和颗粒中杂质的质量分数

2008-07-01

Testing of ceramic raw and basic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP OES) and by electrothermal vaporization (ETV) under the action of a halogenated reaction gas (modifiers)
陶瓷原材料和基础材料的试验.在卤化反应的作用下 通过电感耦合等离子体（ICP OES）和电热蒸发（ETV）的光发射光谱法直接测定石墨粉末、颗粒和块状物中痕量杂质的质量分数

2017-05-01