本技术报告的目的是描述全世界实际和模拟电磁脉冲测试期间发生的影响。这些影响包括1962年美国和苏联进行的高空核试验中观察到的影响，以及许多国家在大气试验结束后的几年中进行的HEMP模拟试验。除直接影响外，本技术报告还包含有关HEMP与“长线”耦合的信息，因为验证HEMP在这些线路上可感应特定水平的电流和电压非常重要；这为电子设备的直接注入测试提供了基础。应该注意的是，在大多数情况下，被测试或暴露的电气设备不包含当前使用的敏感电子设备。 还应强调的是，所有测试和暴露不会导致设备故障；HEMP相互作用的几何形状和设备的电磁屏蔽等因素是可能产生不同结果的变量。对这些影响的描述旨在说明大麻对现代电子系统可能产生的影响的严重性。

The purpose of this Technical Report is to describe the effects that have occurred during actual and simulated electromagnetic pulse testing throughout the world. These effects include those observed during the high-altitude nuclear tests conducted by the United States and the Soviet Union in 1962, and the HEMP simulator tests conducted by many countries during the years after atmospheric testing ended. In addition to direct effects, this technical report also contains information on HEMP coupling to "long lines" as it is important to verify that particular levels of currents and voltages can be induced by HEMP on these lines; this provides a basis for direct injection testing of electronic equipment. It should be noted that, in most cases, the electrical equipment tested or exposed did not contain the sensitive electronics in use today. Also it should be emphasized that all tests and exposures did not produce failure of the equipment; factors such as the geometry of the HEMP interaction and the electromagnetic shielding of the equipment are variables that can produce differing results. The description of these effects is intended to illustrate the seriousness of the possible effects of HEMP on modern electronic systems.