IEC 62215-3:2013规定了一种测量集成电路（IC）对标准传导电气瞬态干扰抗扰度的方法。干扰不一定与被测设备（DUT）的运行同步，而是通过耦合网络施加到IC引脚上。这种方法能够理解和分类传导瞬态干扰和IC中诱导的性能退化之间的相互作用，而不管瞬态是否在规定的工作电压范围内。

IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.