Scanning probe coordinate measuring machines have many advantages over the traditional touch trigger probe systems due to the fact that a tremendous amount of data can be collected during inspection in a short amount of time. A scanning probe maintains constant contact with the part surface during inspection generating a contact force between the probe and part. This deflects the probe tip from its free position. To maintain accuracy, this force must be precisely controlled. Simultaneously, probe movement tangent to the part surface must also be controlled. This paper formulates the scanning probe control problem in terms of the hybrid class of force/position controllers commonly investigated in the field of robotic manipulator control.