Advanced technical ceramics. Mechanical properties of monolithic ceramics at room temperature-Method of test for edge-chip resistance
高级技术陶瓷 单片陶瓷在室温下的机械性能 边缘切屑电阻的试验方法
发布日期:
2010-09-30
交叉引用:EN 623-4EN ISO 7500-1ISO 7500-1:2004EN ISO 17025ISO/IEC 17025:2005EN 843-4EN 1071-3购买本文件时可用的所有现行修订版均包含在购买本文件中。
Cross References:EN 623-4EN ISO 7500-1ISO 7500-1:2004EN ISO 17025ISO/IEC 17025:2005EN 843-4EN 1071-3All current amendments available at time of purchase are included with the purchase of this document.