BS ISO 19668:2017规定了X射线光电子中元素检测极限的程序 光谱学（XPS）可以根据常见分析情况下特定样品的数据进行估算 并报告。本文件适用于均质材料，如果深度 在该技术的信息深度内，元素的分布是不均匀的。交叉引用:ISO 18115-1:2013 ED2ISO 18115-2:2013 ED2ISO 11843-6:2013ISO 18118:2015 ED2ISO 20903:2011 Ed 2ISO 10810:2010购买本文件时可获得的所有现行修订均包含在购买本文件中。

BS ISO 19668:2017 specifies a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.Cross References:ISO 18115-1:2013 ED2ISO 18115-2:2013 ED2ISO 11843-6:2013ISO 18118:2015 ED2ISO 20903:2011 Ed 2ISO 10810:2010All current amendments available at time of purchase are included with the purchase of this document.