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现行 ICEA T-32-645-2012(R2017)(R2023)
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Test Method for Establishing Volume Resistivity Compatibility of Water Blocking Components With Extruded Semiconducting Shield Materials 用挤压半导体屏蔽材料确定阻水部件体积电阻率兼容性的试验方法
发布日期: 2017-02-23
ICEA T-32-645-2012(R2017)提供了确定阻水体电阻率兼容性的程序 中压、高压或超高压电力电缆中使用的挤压半导体屏蔽组件。这个 相容性试验旨在验证用作绝缘材料的半导体材料的电气性能 当导体或绝缘屏蔽暴露在阻水部件中时,不会受到不利影响。 这些阻水部件可以安装在导体、导体和绝缘层上 屏蔽,或围绕金属屏蔽或同心中性点。它描述了一种证明 当 半导体材料在紧急运行时暴露于阻水部件中 电缆的温度。
ICEA T-32-645-2012 (R2017) provides procedures for establishing volume resistivity compatibility of water blocking components with extruded semiconducting shields utilized in MV, HV or EHV power cables. The compatibility test is designed to verify that the electrical properties of a semiconducting material used as a conductor or insulation shield are not adversely affected when exposed to a water blocking component. These water blocking components can be incorporated in a conductor, over a conductor, over an insulation shield, or around a metallic shield or concentric neutral. It describes a test method of demonstrating that the volume resistivity and volume resistivity stability remain within their specified limits when a semiconducting material is exposed to a water blocking component at the emergency operating temperature of the cable.
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