本标准适用于高纯度锗的体积特性测量，因为它们与伽马射线和x射线锗探测器的制造和性能有关。这种锗是单晶，每立方厘米的净浓度小于1011个电活性杂质中心，通常在1010立方厘米左右。IEEE Std 325-1986和IEEE Std 759-19给出了制造锗探测器的测试和测量程序

This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm-3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19