IEC 61051-1:20 18作为IEC 61051-1:20 18 RLV提供，其中包含国际标准及其红线版本，显示了与上一版本相比技术内容的所有变化。IEC 61051-1:20 18是一个通用规范，适用于电子设备中使用的具有对称电压-电流特性的压敏电阻。它建立了标准术语、检验程序和测试方法，用于质量评估或任何其他目的的分段和详细规范。与上一版相比，此版本包括以下重大技术变更: a）增加了10个新的术语和定义——引线压敏电阻、表面贴装压敏电阻（SMV）、静电放电（ESD）、ESD箝位电压、等效矩形脉冲持续时间、最大峰值电流降额特性、额定平均耗散功率、额定能量、异常过电压耐受持续时间和温度降额曲线（见3。6、3.7、3.14、3.15、3.19、3.20、3.23、3.24、3.25和3.29)； b)增加了电气试验的一般要求和7个新的试验项目——箝位电压、ESD箝位电压、最大峰值电流、额定平均耗散功率、额定能量、静电放电（ESD）、表面贴装压敏电阻终端的鲁棒性（见6.5、6.11、6.12、6.13、6.14、6.15、6.16和6.17.8）； c）在6.6、6.7、6.8、6.9.3、6.23.2、6.23.4和6.26中，修订了以下测试项目: -压敏电阻电压、漏电流和电容:增加了更详细的要求和信息； -电压验证-箔法:箔的边缘和每个终端之间的空间已经从1mm~1.5 mm改变为3mm~3.5 mm，用于测试不具有轴向终端的变阻器，并且箔和终端之间的最小空间已经从1mm改变为3mm，用于测试具有轴向终端的变阻器；-气候序列-干热:方法从Ba改为Bb； -气候序列-寒冷:方法已从Aa改为Ab； -在上类别温度下的耐久性:“以1.5小时接通和0.5小时断开的循环施加测试电压”的方法已改为在持续1 000小时的整个测试期间连续施加测试电压的方法； d)试验测量程序部分删除了脉冲电流、脉冲条件下的电压和凸点的试验项目； e)删除了附件A和附件A中提及试验夹具的内容； f)删除了所有与碳化硅压敏电阻相关的内容； g)增加了题为“本规范中使用的测试脉冲”的新规范性附件（附件B）； h）增加了一个新的资料性附件，题为“供应用参考的特性和参数的推荐测量/测试方法”（附件C），其中测量/测试指南给出了电压电流特性、最大峰值电流降额特性、热阻和异常过电压耐受持续时间等特性和参数，可供应用参考。

IEC 61051-1:2018 is available as IEC 61051-1:2018 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61051-1:2018 is a generic specification and is applicable to varistors with symmetrical voltage-current characteristics for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications for quality assessment or any other purpose. This edition includes the following significant technical changes with respect to the previous edition:
a) 10 new terms and definitions – leaded varistors, surface mount varistors(SMV), electrostatic discharge (ESD), ESD clamping voltage, equivalent rectangular pulse duration, maximum peak current derating characteristic, rated average dissipation power, rated energy, abnormal overvoltage withstanding duration and temperature derating curve – have been added (see 3.6, 3.7, 3.14, 3.15, 3.19, 3.20, 3.23, 3.24, 3.25 and 3.29);
b) General requirements for electrical tests and 7 new test items – clamping voltage, ESD clamping voltage, maximum peak current, rated average dissipation power, rated energy, electrostatic discharge (ESD), robustness of terminations of surface mount varistors – have been added (see 6.5, 6.11, 6.12, 6.13, 6.14, 6.15, 6.16 and 6.17.8);
c) In 6.6, 6.7, 6.8, 6.9.3, 6.23.2, 6.23.4 and 6.26, following test items have been revised:
- Varistor voltage, leakage current and capacitance: more detailed requirements and information have been added;
- Voltage proof – foil method: the space between the edge of the foil and each termination has been changed from 1 mm ~ 1,5 mm to 3 mm ~ 3.5 mm for testing varistors not having axial terminations and the minimum space between the foil and the termination has been changed from 1 mm to 3 mm for testing varistors having axial terminations;
- Climatic sequence – dry heat: the method has been changed from Ba to Bb;
- Climatic sequence – cold: the method has been changed from Aa to Ab;
- Endurance at upper category temperature: the method of “applying test voltages in cycles of 1,5 h on and 0,5 h off” has been changed to the method of applying test voltages continuously throughout the test lasting for 1 000 h;
d) The test items of pulse current, voltage under pulse condition and bump have been deleted from the section of test and measurement procedures;
e) Annex A and the contents referring to the test fixture specified in Annex A have been deleted;
f) All contents related to silicon carbide varistors have been deleted;
g) A new normative annex entitled “Test pulses used in this specification” (Annex B) has been added;
h) A new informative annex entitled "Recommended measurement/test methods for characteristics and parameters for application reference" (Annex C) has been added, in which guidelines of measuring/testing characteristics and parameters for application reference including voltage vs. current characteristic, maximum peak current derating characteristic, thermal resistance and abnormal overvoltage withstanding duration have been given.