包含评估集成电路（IC）抗快速传导同步瞬态干扰能力的测试方法的一般信息和定义。目的是描述获得ICs免疫定量测量的一般条件，建立统一的测试环境。描述了预计会影响试验结果的关键参数。与本规范的偏差应在单独的试验报告中明确注明。 这种同步瞬态抗扰度测量方法使用短脉冲，以不同幅度、持续时间和极性的快速上升时间对IC进行传导。在这种方法中，施加的脉冲必须与IC的活动同步，以确保受控和可再现的条件得到保证

Contains general information and definitions on the test method to evaluate the immunity of integrated circuits (ICs) against fast conducted synchronous transient disturbances.The objective is to describe general conditions to obtain a quantitative measure of immunity of ICs establishing a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this specification should be explicitly noted in the individual test report. This synchronous transient immunity measurement method uses short impulses with fast rise times of different amplitude, duration and polarity in a conductive mode to the IC. In this method, the applied impulse has to be synchronized with the activity of the IC to make sure that controlled and reproducible conditions can be assured