Chemical analysis of raw materials and refractory products containing silicon-carbide, silicon-nitride, silicon-oxynitride and sialon - Part 4: XRD methods (ISO 21068‑4:2024)
含碳化硅、氮化硅、氮氧化硅和赛隆的原材料和耐火制品的化学分析第4部分:X射线衍射法
This document describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer.
It includes details of sample preparations and general principles for qualitative and quantitative analyses of mineralogical phase composition. Quantitative determination of α-Si3N4, β-Si3N4, Si2ON2, AlN, and β’- SiAlON are described.
For quantitative determination of α-Si3N4, β-Si3N4, Si2ON2, AlN and β’-SiAlON refinement procedures based on the total nitrogen content of the sample are described.
NOTE ISO 21068-3 is used for the analysis of the total nitrogen content of the sample.