Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
精细陶瓷(高级陶瓷、高级工业陶瓷) 用平行X射线束X射线衍射法测定单晶薄膜(晶圆)结晶质量的试验方法
This document specifies the test method for measuring the crystalline quality of single-crystal thin film (wafer) using the XRD method with parallel X-ray beam. This document is applicable to all of the single-crystal thin film (wafer) as bulk or epitaxial layer structure.All current amendments available at time of purchase are included with the purchase of this document.