Liquid crystal display devices-Measuring methods for liquid crystal display modules. Motion artifact measurement of active matrix liquid crystal display modules
液晶显示器件
发布日期:
2011-09-30
交叉引用:IEC 61747-6EN 61747-6IEC 61747-1:2003IEC 61747-5:1998ISO 9241ISO 11664-4:2008EN 61747-1:1999EN 61747-1:1999/A1:2003EN 61747-5:1998EN ISO 9241-307EN ISO 11664:2011购买本文件时提供的所有当前修改件均包括在内。
Cross References:IEC 61747-6EN 61747-6IEC 61747-1:2003IEC 61747-5:1998ISO 9241ISO 11664-4:2008EN 61747-1:1999EN 61747-1:1999/A1:2003EN 61747-5:1998EN ISO 9241-307EN ISO 11664-4:2011All current amendments available at time of purchase are included with the purchase of this document.