IEC？TR？62396-7:20 17是一份技术报告，描述了说明大气辐射对电子设备的影响的过程。大气辐射引起的单事件效应（见）是一类可能的故障机制，在电子设备和相关功能的安全性和可靠性分析中得到解决。本文件侧重于电子元件、电子设备和相关的电子功能。本文档不涉及系统级分析。本文件旨在描述在电子设备设计、设计审查中考虑SEE的方法，它可以在航空航天认证过程中提供帮助。

IEC？TR？62396-7:2017 is a technical report which describes a process to account for the effects of atmospheric radiation on electronic equipment. Single event effects (SEE) due to atmospheric radiation are one class of possible failure mechanisms that are addressed in the safety and reliability analyses of electronic equipment and associated functions. This document focuses on electronic components, electronic equipment and associated electronic functions. System level analysis is not addressed in this document. This document is intended to describe an approach to accounting for SEE in electronic equipment design, design review, and it can provide aid in the aerospace certification process.