1.1 本规程定义了仪器压痕测试（IIT）的基本步骤，并确定了仪器成功执行测试和产生可用于测定压痕硬度和其他材料特性的数据所需的要求、精度和能力。IIT是一种机械试验，通过将压头压入材料中，并监测压头上的力和位移，作为全加载-卸载试验循环期间时间的函数，测量材料对成型压头施加的应力和应变的响应。 1.2 IIT仪器的操作特征以及仪器验证要求( 附件A1 )，标准参考试块( 附件A2 )和压头要求( 附件A3 )定义。本规程并非IIT仪器的完整采购规范。 1.3 非强制性的除外 附录X4 ，本规程未定义确定材料特性所需的分析。该分析留待其他测试方法使用。 附录X4 包括一些基本分析技术，以允许使用试块对IIT仪器进行间接性能验证。 1.4 零点测定、仪器顺应性测定和间接测定压头面积函数是IIT过程的重要组成部分。本规程定义了这些项目的要求，并包括非强制性附录，以帮助用户定义这些要求。 1.5 本规程不包括故意横向位移的使用（即划痕试验）。 1.6 以国际单位制表示的数值应视为标准值。本标准不包括其他计量单位。 1.7 本标准并非旨在解决与其使用相关的所有安全问题（如有）。 本标准的用户有责任在使用前制定适当的安全和健康实践，并确定监管限制的适用性。 ====意义和用途====== 5.1 当由于样品的尺寸或条件而无法使用其他传统的材料性能测定方法时，IIT仪器用于定量测量薄涂层和其他体积材料的各种机械性能。本规程将确定这些仪器的基本要求。旨在使基于IIT的试验方法能够参考本规程，了解获得有意义的试验结果所需的力和位移精度、再现性、验证、报告等的基本要求。 5.2 IIT不限于特定的试验力、位移范围或压头类型。本规程涵盖了广泛的纳米、微观和宏观要求（见ISO 14577）- 1） 压痕测试应用。要求各种IIT仪器在其特定设计范围内符合实践要求。

1.1 This practice defines the basic steps of Instrumented Indentation Testing (IIT) and establishes the requirements, accuracies, and capabilities needed by an instrument to successfully perform the test and produce the data that can be used for the determination of indentation hardness and other material characteristics. IIT is a mechanical test that measures the response of a material to the imposed stress and strain of a shaped indenter by forcing the indenter into a material and monitoring the force on, and displacement of, the indenter as a function of time during the full loading-unloading test cycle. 1.2 The operational features of an IIT instrument, as well as requirements for Instrument Verification ( Annex A1 ), Standardized Reference Blocks ( Annex A2 ) and Indenter Requirements ( Annex A3 ) are defined. This practice is not intended to be a complete purchase specification for an IIT instrument. 1.3 With the exception of the non-mandatory Appendix X4 , this practice does not define the analysis necessary to determine material properties. That analysis is left for other test methods. Appendix X4 includes some basic analysis techniques to allow for the indirect performance verification of an IIT instrument by using test blocks. 1.4 Zero point determination, instrument compliance determination and the indirect determination of an indenter’s area function are important parts of the IIT process. The practice defines the requirements for these items and includes non-mandatory appendixes to help the user define them. 1.5 The use of deliberate lateral displacements is not included in this practice (that is, scratch testing). 1.6 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. ====== Significance And Use ====== 5.1 IIT Instruments are used to quantitatively measure various mechanical properties of thin coatings and other volumes of material when other traditional methods of determining material properties cannot be used due to the size or condition of the sample. This practice will establish the basic requirements for those instruments. It is intended that IIT based test methods will be able to refer to this practice for the basic requirements for force and displacement accuracy, reproducibility, verification, reporting, etc., that are necessary for obtaining meaningful test results. 5.2 IIT is not restricted to specific test forces, displacement ranges, or indenter types. This practice covers the requirements for a wide range of nano, micro, and macro (see ISO 14577-1) indentation testing applications. The various IIT instruments are required to adhere to the requirements of the practice within the their specific design ranges.