现行

IEC 62132-8-2012

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
集成电路 - 电磁抗扰度测量 - 第8部分:辐射抗扰度测量 - IC带状线法

2012-07-06

现行

IEC TS 62132-9-2014

Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
集成电路电磁抗扰度测量第9部分:辐射抗扰度测量表面扫描法

2014-08-21

现行

GB/T 42968.8-2023

集成电路 电磁抗扰度测量 第8部分：辐射抗扰度测量 IC带状线法
Integrated circuits—Measurement of electromagnetic immunity—Part 8: Measurement of radiated immunity—IC stripline method

2023-09-07

现行

GB/T 42968.2-2024

集成电路 电磁抗扰度测量 第2部分：辐射抗扰度测量 TEM小室和宽带TEM小室法
Integrated circuits—Measurement of electromagnetic immunity—Part 2: Measurement of radiated immunity—TEM cell and wideband TEM cell method

2024-10-26

现行

BS EN 62132-8-2012

Integrated circuits. Measurement of electromagnetic immunity-Measurement of radiated immunity. IC stripline method
集成电路 电磁抗扰度的测量

2012-10-31

现行

BS EN 62132-1-2016

Integrated circuits. Measurement of electromagnetic immunity-General conditions and definitions
集成电路 电磁抗扰度的测量

2016-03-31

现行

IEC 62132-1-2015

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
集成电路 - 电磁抗扰度测量 - 第1部分:一般条件和定义

2015-10-29

现行

GB/T 42968.1-2023

集成电路 电磁抗扰度测量 第1部分：通用条件和定义
Integrated circuits—Measurement of electromagnetic immunity—Part 1: General conditions and definitions

2023-09-07

现行

BS EN 62132-2-2011

Integrated circuits. Measurement of electromagnetic immunity-Measurement of radiated immunity. TEM cell and wideband TEM cell method
集成电路 电磁抗扰度的测量

2011-04-30

现行

BS 09/30191126 DC

BS EN 62132-8. Integrated circuits. Measurement of electromagnetic immunity. Part 8. Measurement of radiated immunity. IC Stripline method
英国标准EN 62132-8 集成电路 电磁抗扰度的测量 第八部分 辐射抗扰度的测量 集成电路带线法

2009-02-03

现行

DIN IEC/TS 62132-9

Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014)
集成电路电磁抗扰度测量第9部分:辐射抗扰度测量表面扫描法（IEC/TS 62132-9-2014）

2015-08-01

现行

IEC TS 62215-2-2007

Integrated circuits - Measurement of impulse immunity - Part 2: Synchronous transient injection method
集成电路脉冲抗扰度测量第2部分:同步瞬态注入法

2007-09-10

现行

GB/T 43034.2-2024

集成电路 脉冲抗扰度测量 第2部分: 同步瞬态注入法
Integrated circuits—Measurement of impulse immunity—Part 2: Synchronous transient injection method

2024-10-26

现行

DIN EN 62132-2

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010); German version EN 62132-2:2011
集成电路.电磁抗扰度测量.第2部分:辐射抗扰度测量.TEM室和宽带TEM室法（IEC 62132-2-2010）；德文版EN 62132-2:2011

2011-07-01

现行

BS 05/30137850 DC

IEC 62215-2. Integrated circuits. Measurement of impulse immunity. Part 2. Impulse injection method
IEC 62215-2 集成电路 脉冲抗扰度的测量 第二部分 脉冲注入法

2005-08-10

现行

BS 12/30268333 DC

BS EN 62132-1. Integrated circuits. Measurement of electromagnetic immunity. General conditions and definitions
英国标准EN 62132-1 集成电路 电磁抗扰度的测量 一般条件和定义

2012-07-11

现行

DIN IEC 62132-8-DRAFT

Draft Document - Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method (IEC 47A/811/CD:2009)
文件草案——集成电路——电磁抗扰度测量——第8部分:辐射抗扰度测量——IC带状线法（IEC 47A/811/CD:2009）

2009-05-01

现行

IEC 62132-5-2005

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
集成电路 - 电磁抗扰度测量 150 Khz至1 Ghz - 第5部分:工作台法拉第笼式

2005-10-10

现行

BS EN 62132-5-2006

Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz-Workbench Faraday cage method
集成电路 电磁抗扰度测量 150 kHz至1 GHz

2006-03-31

现行

IEC 62132-4-2006

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
集成电路 - 电磁抗扰度测量150 Khz至1 Ghz - 第4部分:直接Rf功率注入法

2006-02-21